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 Advanced Probing Solutions JEM Web Portal   Upcoming Events
 

VC-Series

  

VS-Series

  

VE-Series

Multi-DUT Memory Devices (Flash, SDRAM)

Multi-DUT Logic Devices

Wafer Level Burn-In (8" Full Wafer)

Area Arrays

Flip Chips (C4)

Solder or Cu Bumps

 Image Sensor Devices

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 SW Test Workshop

 

June 3 ~ June 5, 2024

San Diego, California, USA
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