With the rapidly increasing usage of image sensors in camera-equipped cellular phones and digital cameras, JEM has developed the VE-Series Probe Cards for high parallelism testing of image sensor devices.  VE-Series is a hybrid of cantilever and vertical probing technologies featuring enhanced signal integrity by reduced probe length (approx. 2.5mm).  With multi-site parallel testing capability, the VE-Series probe card is an advanced yet cost-effective solution image testing solution with reduced test time and high throughput.

The VE-Series probe cards are specially designed to accommodate illuminator system (light source)  for image sensors.   They work with various image sensor tester systems (e.g. Teradyne IP750EP).